Light adjustable aberration conjugator

ABSTRACT

A method of correcting aberrations in an optical system by applying a light adjustable aberration conjugator layer to a component of the system, determining the nature of the aberration, applying radiation to the conjugator layer such as to change the refraction and/or shape of the conjugator layer to compensate for the aberration, and locking in the desired optical property.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is based on U.S. Application Ser. No. 60/239,349, filedOct. 11, 2000.

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates to methods of correcting for aberrations in anoptical system, more specifically through the use and placement of mediaat appropriate positions in an optical system, the properties of themedia being such that the refraction of the media can be modified byexposure of the media to light.

2. Background Information

Adaptive optical systems have been employed by astronomers, opticalengineers, and vision scientists to compensate for wavefront aberrationsgenerated by the atmosphere, telescope optics, optical design errors,and the inherent wavefront errors of the human visual system. In thesesystems, a wavefront sensor is used to measure the aberrations from thetarget to the imaging sensor. A computer is used to calculate theconjugate to the measured aberrations and deform a mirror with actuatorsto place the conjugate aberration on the deformable mirror's surface.The deformable mirror (DM) is usually placed at the image of the pupilto minimize isoplanatic errors in the optical system. When the DM is notplaced at the pupil or an image of the pupil, the angular field of view,which the aberrations are corrected over, will not be as large.

To correct optical system aberrations, opticians will polishcompensating surfaces on one of the elements. As an example, conjugateerrors are often polished into the secondary mirror of a two-mirrortelescope to compensate for errors in the primary mirror. This processcan take hours in a production shop and days in a precision opticalfabrication facility. As another example, the spherical aberrationspresent in typical camera systems are removed by polishing an asphericsurface onto one of the lens surfaces. Thus, fabricating an aberrationconjugator as such is known and has been used in a number ofapplications.

In addition to adaptive optics and optical polishing, other approachesaddress the correction of aberrations in optical systems. These includeion polishing, the deposition of thin films, the use of binary optics,holographic elements, real time holography, and spatial lightmodulators.

All of these approaches have drawbacks. For example ion polishing andthin film deposition must be performed in a vacuum. Virtually all ofthese methods are costly and time consuming. Some are disadvantageousbecause of low efficiencies or because polarized light must be used. Aless labor intensive, cost effective, and faster method of correctingaberrations in optical systems would provide significant advantages.

SUMMARY OF THE INVENTION

The present invention is a method of correcting aberrations in anoptical system, and the correction structure that results from themethod. More particularly, aberrations in an optical system arecorrected by applying a light adjustable aberration conjugator layer toa component of the system, measuring the type and magnitude of theaberrations, applying radiation to the conjugator layer to change therefraction of the conjugator layer to compensate for the aberration, andlocking in the desired optical property. The light adjustable mediacomprises a refraction modulating composition (RMC) dispersed in apolymer matrix. Optical and optical system aberrations arise fromfabrication, alignment, and residual design errors. The aberrationinformation in the optical system is measured to determine the exposureprofile needed to convert a layer of the media placed in the appropriatepart of the optical system into a form which will be the conjugate ofthe aberration and therefore null the aberration. Thus, the method ofthe invention, and the structure created thereby, will correct fixedaberrations in an optical system by putting the conjugate aberrations ofthe optical system on one of the surfaces in the optical system.

The foregoing has outlined rather broadly the features and technicaladvantages of the present invention in order that the detaileddescription of the invention that follows may be better understood. Theforegoing and additional features and advantages of the invention thatwill be described hereinafter form the subject of the claims of theinvention. It should be appreciated by those skilled in the art that theconception and specific embodiment disclosed might be readily utilizedas a basis for modifying or designing other structures for carrying outthe same purposes of the present invention. It should also be realizedby those skilled in the art that such equivalent constructions do notdepart from the spirit and scope of the invention as set forth in theappended claims. The novel features which are believed to becharacteristic of the invention, both as to its organization and methodof operation, together with further objects and advantages will bebetter understood from the following description when considered inconnection with the accompanying Figures. It is to be expresslyunderstood, however, that each of the Figures is provided for thepurpose of illustration and description only and is not intended as adefinition of the limits of the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention herein will be better understood by reference to theattached figures, in which:

FIG. 1 shows a light adjustable aberration conjugator layer applied tothe surface of a center negative element in a double Gauss lens;

FIG. 2 a shows a light adjustable aberration conjugator layer applied tothe secondary mirror of a telescope, for reflection from the layer;

FIG. 2 b shows a light adjustable aberration conjugator layer applied tothe secondary mirror of a telescope, for transmission through the layerfor reflection from the mirror;

FIG. 3 a shows a light adjustable aberration conjugator layer applied toeither the forward or rearward surface of a window at the exit pupil ofa telescope having a particular construction;

FIG. 3 b shows a light adjustable aberration conjugator layer applied toeither the rearward surface of a window at the exit pupil of a telescopeof another construction;

FIG. 4 shows an exposed light adjustable aberration conjugator layer ona flat substrate; and

FIG. 5 shows a light adjustable aberration conjugator layer that isprotected between two planes, window type substrates.

DESCRIPTION OF REPRESENTATIVE EMBODIMENTS

The purpose of this invention is to more easily correct the fixedaberrations in an optical system by placing the conjugate of the opticalsystem aberrations on one of the surfaces in the optical system. Fixed,optical system aberrations include aberrations from fabrication,alignment, and residual design errors. Correcting the fixed aberrationswith light rather than by polishing or by the use of deformable mirrorssaves time and money. The invention has advantages over ion polishing,surface layered optical coatings and deposited masks, which have to beperformed in a vacuum and the surface being modified must be on an outersurface. The invention also has advantages over surface buildup withoptical coatings and masks because they also have to be applied in avacuum chamber and to an outer surface. The light adjustable materialdescribed herein can be applied to any surface in the optical train, aslong as the optical system transmits enough of the light at theirradiation wavelength to cause polymerization of the dispersedrefractive modulating composition (RMC). The method of the inventionneed not be performed in a vacuum.

The media used in the invention to correct optical system aberrations isa light sensitive material. In particular, the material comprises afirst polymer matrix and a refraction modulating composition (RMC)dispersed therein, which will be described in greater detailhereinafter. When it is exposed as described herein, in the appropriatemanner, the refraction of the material changes to compensate foraberrations in the optical system. It is referred to herein as a lightadjustable aberration conjugator. The starting material can be applied,in a preferred embodiment, in a thin layer, approximately 1 mm thick, toalmost any surface in the optical system, preferably to one of thesmaller surfaces.

FIG. 1 shows a light adjustable aberration conjugator layer 10 appliedto an interior lens surface, specifically, to the surface of centernegative element 12 in a double Gauss lens 14.

FIG. 2 a shows a light adjustable aberration conjugator layer 16 appliedto the secondary mirror 18 of a telescope 20 for reflection from thelayer 16. In this case the layer is coated with a reflective coatingafter irradiating with the profiling beam and the locking beam. FIG. 2 bshows a light adjustable aberration conjugator-transmitting layer 22placed over a mirror surface 24 of a telescope 26 and used in a doublepass. This is referred to as a catadioptric design and corrects forfabrication errors but not for alignment errors after re-installing thesecondary mirror.

FIG. 3 a shows a light adjustable aberration conjugator layer 28 or 28 aapplied to a window 30 at the exit pupil of a telescope 32 of aparticular construction, on either the front surface of the forward lens34 or the rear surface of the rearward lens 36. FIG. 3 b shows a lightadjustable aberration conjugator layer 38 applied to the rear surface ofthe rearward lens 40 at the exit pupil of a telescope 42 of anotherconstruction. The telescopes can have a small refractive design or alarger reflective design. Since the aberration conjugator layer is onthe outside of the optical system, at a pupil plane, and on a non-powerelement, it is the easiest to implement and can be added at any timeafter the optical system is fabricated. The advantages are much greaterif the telescope is a large two-mirror reflective telescope. All opticalsystems will have some amount of fabrication errors. The tolerance onthese errors will depend on its application and the cost will depend onthe tolerances specified by the user.

The light adjustable aberration conjugator layer 44 can be placed on aflat substrate 46 and be exposed as shown in FIG. 4 (or as shown in FIG.3), or it can be protected by another lens in the system (as shown witha curved surface in FIG. 1. Another technique is to place the lightadjustable aberration conjugator layer between two optical substrates. Avoid 48 between the light adjustable aberration conjugator layer 50,shown in FIG. 5, and opposing protecting windows 52 and 54 (which could,alternatively, be lenses) can be a vacuum or it can be filled with agas, liquid or solid. An example of a suitable solid is another polymerthat is polymerized after pouring over the light adjustable aberrationconjugator. It would have to have a different refractive index to beeffective, unless the refractive index modulation alone providessufficient aberration correction. There are several advantages of usinga liquid or solid over the light adjustable aberration conjugator layer,i.e., the light adjustable aberration conjugator layer is betterprotected and the layer does not have to be as precise. The disadvantageis that the dynamic range of correction will be less.

One embodiment of this invention is to use a wavefront sensor such as aninterferometer or Shack-Hartmann sensor to measure the optical systemaberrations and input them into a computer program that contains a lightadjustable aberration conjugator nomogram. The computer calculates therequired irradiation pattern. An irradiation system, operating at theappropriate wavelength irradiates the light adjustable aberrationconjugator material with the calculated pattern. A special setup may berequired if the light adjustable aberration conjugator layer is placedon the internal surface of the lens system. A more detailed descriptionof the use of a Shack-Hartmann sensor, and a description of sources forradiation that can be used to expose/irradiate the material to form thelight adjustable aberration conjugator, are given hereinafter under theheading “Exposing a Light Adjustable Aberration Conjugator Layer”

The complete process can be automated for production lines of lenses ormirror telescopes. The process can also be provided as a service if thecustomer sent in the measured aberrations and the pupil size or size ofthe light adjustable aberration conjugator surface. It can also be apost production process if the light adjustable aberration conjugatorwas placed on an exterior surface or an accessible surface. Theinvention can improve the optical performance of many different types ofoptical systems at an affordable cost and schedule. Once the aberrationsare obtained and the setup is complete, the calculations and irradiationtime should take less than 2 minutes and the diffusion time should takebetween 3 to 24 hours. This process reduces the labor, money, and timeintensive processes of optical polishing, ion polishing, and thin filmdeposition. This invention will allow manufactures to correct cameralenses on the assembly line, researchers to correct optics on an opticalbench, astronomers to correct fixed errors on large telescopes, andallow manufactures to design less expensive lens systems byincorporating low cost corrector plates.

In a specific embodiment of the invention, the optical element thatbecomes the light adjustable aberration conjugator comprises a firstpolymer matrix and a refraction modulating composition (RMC) dispersedtherein. Such a composition is described in detail in InternationalApplication Serial No. PCT/US99/41650, filed on Oct. 13, 1999 andpublished Jul. 20, 2000, the disclosure of which is incorporated hereinby this reference. As disclosed in that application, the first polymermatrix forms the optical element framework and is generally responsiblefor many of its material and optical properties. The RMC may be a singlecompound or a combination of compounds that is capable ofstimulus-induced polymerization, preferably photo-polymerization. Asused herein, the term “polymerization” refers to a reaction wherein atleast one of the components of the RMC reacts to form at least onecovalent or physical bond with either a like component or with adifferent component. The identities of the first polymer matrix and theRMCs will depend on the end use of the optical element. However, as ageneral rule, the first polymer matrix and the RMC are selected suchthat the components that comprise the RMC are capable of diffusionwithin the first polymer matrix. Put another way, a loose first polymermatrix will tend to be paired with larger RMC components and a tightfirst polymer matrix will tend to be paired with smaller refractionmodulating composition components.

Upon exposure to an appropriate energy source (e.g., heat or light), theRMC typically forms a second polymer matrix in the exposed region of theoptical element. Light sources that may be used are also described inInternational Application Serial No. PCT/US99/41650. The presence of thesecond polymer matrix changes the material characteristics of thisportion of the optical element to modulate its refraction capabilities.In general, the formation of the second polymer matrix typically changesthe radius of curvature (i.e. the exposed area swells), increases therefractive index, or both, of the affected portion of the opticalelement.

After exposure, the RMC in the unexposed region will migrate into theexposed region over time. The amount of RMC migration into the exposedregion is dependent upon the intensity, wavelength, spatial profile, andduration of the applied light as well as the physical and chemicalproperties of the polymer composition. All of these factors may beprecisely controlled to achieve the desired result. If enough time ispermitted, the RMC components will re-equilibrate and redistributethroughout the optical element (i.e., the first polymer matrix,including the exposed region). When the region is re-exposed to theenergy source, the RMC that has since migrated into the region (whichmay be less than if the refraction modulating composition were allowedto re-equilibrate) polymerizes to further increase the formation of thesecond polymer matrix. This process (exposure followed by an appropriatetime interval to allow for diffusion) may be repeated until the exposedregion of the optical element has developed the desired opticalproperties. At this point, the entire optical element is exposed to theenergy source to “lock-in” the desired optical properties by evenlypolymerizing the remaining RMC components in the optical element. Evenlypolymerizing any remaining RMC components will remove the driving forcefor diffusion (i.e. prevent any further change in refraction) andprohibit any change in the optical properties of the aberrationconjugation layer by subsequent exposure of the optical element to anappropriate energy source.

The first polymer matrix is a covalently or physically linked structurethat functions as structure matrix for the aberration conjugatormaterial and is formed from a first pre-polymer matrix composition. Ingeneral, the first polymer matrix composition comprises one or moremonomers that upon polymerization will form the first polymer matrix.The first polymer matrix composition optionally may include any numberof formulation auxiliaries that modulate and improve any property of theoptical element. Illustrative examples of suitable first pre-polymermatrix composition monomers include acrylics, methacrylates,phosphazenes, siloxanes, vinyls, homopolymers and copolymers thereof. Asused herein, a “monomer” refers to any unit (which may itself either bea homopolymer or copolymer), which may be linked together to form apolymer containing repeating units of the same. If the first pre-polymermatrix composition monomer is a copolymer, it may be comprised of thesame type of monomers (e.g., two different siloxanes) or it may becomprised of different types of monomers (e.g., a siloxane and anacrylic).

In one embodiment, the one or more monomers that form the first polymermatrix are polymerized and cross-linked in the presence of the RMC. Inanother embodiment, polymeric starting material that forms the firstpolymer matrix is cross-linked in the presence of the RMC. Under eitherscenario, the RMC components must be compatible with and not appreciablyinterfere with the formation of the first polymer matrix. Similarly, theformation of the second polymer matrix should also be compatible withthe existing first polymer matrix. Put another way, the first polymermatrix and the second polymer matrix should not phase separate and lighttransmission by the optical element should be unaffected.

As described previously, the RMC may be a single component or multiplecomponents so long as: (i) it is compatible with the formation of thefirst polymer matrix; (ii) it remains capable of stimulus-inducedpolymerization after the formation of the first polymer matrix; and(iii) it is freely diffusable within the first polymer matrix. In oneembodiment, the stimulus-induced polymerization is photo-inducedpolymerization.

Illustrative examples of a suitable first polymer matrix include:poly-acrylates such as poly-alkyl acrylates and poly-hydroxyalkylacrylates; poly-methacrylates such as poly-methyl methacrylate (“PMMA”),poly-hydroxyethyl methacrylate (“PHEMA”), and poly-hydroxypropylmethacrylate (“HPMA”); poly-vinyls such as poly-styrene andpoly-vinylpyrrolidone (“PNVP”); poly-siloxanes such aspoly-dimethylsiloxane; poly-phosphazenes, and copolymers of thereof.U.S. Pat. No. 4,260,725 and patents and references cited therein (whichare all incorporated herein by reference) provide more specific examplesof suitable polymers that may be used to form the first polymer matrix.

In preferred embodiments, the first polymer matrix generally possesses arelatively low glass transition temperature (Tg) such that the resultingoptical element tends to exhibit fluid-like and/or elastomeric behavior,and is typically formed by crosslinking one or more polymeric startingmaterials wherein each polymeric starting material includes at least onecrosslinkable group. Illustrative examples of suitable crosslinkablegroups include but are not limited to hydride, acetoxy, alkoxy, amino,anhydride, aryloxy, carboxy, enoxy, epoxy, halide, isocyano, olefinic,and oxime. In more preferred embodiments, each polymeric startingmaterial includes terminal monomers (also referred to as endcaps) thatare either the same or different from the one or more monomers thatcomprise the polymeric starting materials but include at least onecrosslinkable group. In other words, the terminal monomers begin and endthe polymeric starting material and include at least one crosslinkablegroup as part of its structure. Although it is not necessary for thepractice of the present invention, the mechanism for crosslinking thepolymeric starting material preferably is different than the mechanismfor the stimulus-induced polymerization of the components that comprisethe RMC. For example, if the RMC is polymerized by photo-inducedpolymerization, then it is preferred that the polymeric startingmaterials have crosslinkable groups that are polymerized by anymechanism other than photo-induced polymerization.

In some embodiments there may be used a class of polymeric startingmaterials for the formation of the first polymer matrix comprisingpoly-siloxanes (also known as “silicones”) endcapped with a terminalmonomer which includes a crosslinkable group selected from the groupconsisting of acetoxy, amino, alkoxy, halide, hydroxy, and mercapto. Anexample of one such material isbis(diacetoxymethylsilyl)-polydimethylsiloxane (which ispoly-dimethylsiloxane that is endcapped with a diacetoxymethylsilylterminal monomer).

The RMC is capable of stimulus-induced polymerization, preferablyphoto-induced polymerization and may be a single component or multiplecomponents so long as: (i) it is compatible with the formation of thefirst polymer matrix; (ii) it remains capable of stimulus-inducedpolymerization after the formation of the first polymer matrix; and(iii) it is freely diffusable within the first polymer matrix. Ingeneral, the same type of monomers that are used to form the firstpolymer matrix may be used as a component of the RMC. However, becauseof the requirement that the RMC must be diffusable within the firstpolymer matrix, the RMC generally tend to be smaller (i.e., have lowermolecular weights) than the monomers which form the first polymermatrix. In addition, the RMC may include other components such asinitiators and sensitizers that facilitate the formation of the secondpolymer matrix.

In preferred embodiments, the stimulus-induced polymerization isphoto-polymerization. In other words, the RMC preferably includes atleast one group that is capable of photopolymerization. Illustrativeexamples of such photopolymerizable groups include but are not limitedto acrylate, allyloxy, cinnamoyl, methacrylate, stibenyl, and vinyl. Inmore preferred embodiments, the RMC includes a photoinitiator (anycompound used to generate free radicals) either alone or in the presenceof a sensitizer. Examples of suitable photoinitiators includeacetophenones (e.g., a-substituted haloacetophenones, anddiethoxyacetophenone); 2,4-dichloromethyl-1,3,5-triazines; benzoinmethyl ether; and o-benzoyl oximino ketone. Examples of suitablesensitizers include p-(dialkylamino)aryl aldehyde; N-alkylindolylidene;and bis[p-(dialkylamino)benzylidene] ketone.

In some cases it may be useful to expose the media to light in a seriesof steps, whereby after the first exposure, one would wait an intervalof time and then re-expose the same portion of the media to thestimulus. This procedure generally will induce the furtherpolymerization of the RMC within the exposed portion. These steps can berepeated any number of times until the media has reached the desiredcharacteristic properties. At this point, the method may further includethe step of exposing the entire layer to the stimulus to lock-in thedesired property.

In one form, then, the invention includes or consists of a series ofsteps: in an optical system, determining aberrations to be corrected;applying radiation (such as UV, IR or visible light) sensitive mediaacross or upon one or more optical elements in the system; and, exposingat least a portion of such media to the radiation so as to create anaberration conjugate.

Exposing a Light Adjustable Aberration Conjugator Layer

Details of the use of irradiation sources and methods of patterning theexposure of a light adjustable aberration layer, such as the conjugatelayer used in this invention, are found in an application filed in theUnited States Patent and Trademark office on Sep. 26, 2001, Ser. No.______, entitled “Delivery System for Post-Operative Power Adjustment ofAdjustable Lens” by Ben C. Platt, Christian A. Sandstedt, and James A.Ebel, the disclosure of which is incorporated herein by this reference.An irradiation system can consist of several major parts, 1) irradiationsource, 2) diagnostic system 3) Irradiation Intensity system, and 4)locking system. Each will be described in more detail below.

Irradiation Source

The irradiation source must be compatible with the photosensitivity ofthe material being irradiated. In a particular example, the RMC systemis sensitive to UV radiation between the wavelengths of 325 nm and 380nm so the irradiation source is a UV source. The UV source can be alaser, light emitting diode, or various types of lamps that possess a UVspectrum. The source can also be continuous (CW) or pulsed. For example,the source can be a CW mercury arc lamp fitted with an interferencefilter to produce a beam centered at 365 nm+/−10 nm (full width at fullmaximum. A helium cadmium (HeCd) laser operating at 325 nm and a mercury(Hg) arc lamp spectrally filtered for the emission lines at 334 and 365nm can be used. These UV sources, including the tripled frequency laserdiode pumped solid state YAG laser operating at 355 nm, an argon ionlaser operating in the 350-360 nm range, a deuterium discharge lamp, andbroad band xenon:mercury lamps operating with any narrow band spectralfilter are useful sources for providing UV irradiation. A UV LED canalso be a suitable energy source. For example, one can use a UV LEDavailable on the market that has an optical output power of 0.75 to 1 mWcentered at 370 nm with a full width half max spectral bandwidth of+/−10 nm.

Diagnostic System

A diagnostic system is used to measure the aberrations in the opticalsystem before, during, and/or after irradiation. There are manyinstruments available to measure such aberrations. Five common wavefrontsensors used today are based on the Schemer disk, the Shack Hartmannwavefront sensor, the Hartmann screen, and the Fizeau and Twymann-Greeninterferometers. In a particular implementation: a) a Shack Hartmannwavefront sensor is used to measure the aberrations in the opticalsystem; b) a nomogram of the light adjustable conjugator layer'sresponse to irradiation is then consulted to determine the requiredintensity profile to correct the measured aberrations; c) the requiredintensity profile is placed on a static mask (e.g. an apodizing filter)or a programmable mask generator (such as a digital mirror device); d) acalibration camera is used in a closed loop operation to correct thedigital mirror device to compensate for aberrations in the projectionoptics and non-uniformity in the light source; e) the light adjustableaberration conjugator layer is irradiated for the prescribed durationusing the appropriate wavelength, intensity, and spatial profile; and f)after a specified diffusion time, the aberrations in the optical systemare re-measured to ensure that the proper correction was made. Ifnecessary, the process is repeated until the correction is withinacceptable limits.

Irradiation Intensity System

Depending upon the light adjustable conjugator layer formulation,exposure to the appropriate frequency of light will cause the RMC todiffuse into the irradiated volume producing a concomitant change in therefraction of the light adjustable aberration conjugator layer. Themajority of the change in refraction of the conjugator layer is due toswelling or shrinkage in the affected region. Although, it is possiblethat some localized change in refractive index could occur as well sincethe refractive index of a closed thermodynamic system such as theconjugator layer is proportional to the number of particles per volume.The photo reactive macromer in the irradiated region will polymerizeproducing a difference in chemical potential between the irradiated andunirradiated regions of the material. To reestablish thermodynamicequilibrium, the RMC in the unexposed region will diffuse towardsirradiated regions producing localized swelling and a change inrefractive power.

A spatial light modulator (SLM) can be used to generate a customizedirradiation intensity profile for a composition comprising a RMCdispersed in a polymer matrix forming the light adjustable aberrationconjugator layer. The SLM can be any suitable ones known to one skilledin the art. For example, it can be a liquid crystal display (LCD) or adigital light processor (DLP). Electromagnetic radiation in the UV,visible, or near infrared portions of the spectrum is easily projectedusing a projection system similar to the ones used in commercialvideo/computer projection systems. Nevertheless, these projectors usethe LCD or DLP to replace the film used in the projectors. LCDs canoperate in either transmission or reflection mode. Since they rotate theplane of polarization of the light, polarized light and an analyzer mustbe incorporated into the optical system.

DLPs are composed of an array of tiny square mirrors typically 17microns on a side. Rather than modulate the intensity of the beam, theymodulate the time the beam is on the screen. The tiny mirrors tilt +/−10degrees at a rate of 60 kHz. If the mirror is activated to the onposition, the light striking the mirror is reflected into the projectionlens. If the mirror is in the off position, the light reflects to a beamdump and does not make it to the screen. For each of the 60 kHz frames,each mirror is either ON or OFF. Thus, the mirror activation is binary.For uniform illumination on the DLP, the energy density profile appliedto the conjugator layer is proportional to the number of times eachmirror is activated and not to the intensity of the beam.

The method of using constant incident intensity and spatially varyingthe exposure time has several advantages: a) it avoids trying to produceexposure levels below the intensity threshold level (the minimumirradiation level to produce a refractive change of the aberrationconjugator layer), b) it avoids having to compensate for the materialefficiency versus intensity level, and c) it makes the nomograms (a plotdetailing the response of a light adjustable aberration conjugator layerto light intensity, profile, and duration) much easier to develop.

Alternatively, static apodizing filters can be used in a conventionalfilm projection type of system to project an irradiation pattern ontothe conjugator layer. As an example, UV light can be projected throughan apodizing mask possessing a $1 - \frac{r^{2}}{r_{\max}^{2}}$transmission profile. Such an intensity profile enables the lightadjustable aberration conjugator layer to produce desirable opticalrefractive changes in the underlying lens. Other transmission intensityprofiles that are useful for irradiating the aberration conjugator layerinclude, but are not limited to,$I = {I_{0}( {{a\quad\frac{r^{2}}{r_{\max}^{2}}} + b} )}$where the coefficients a and b can range from 0 to 1,${I = {I_{0}( {1 - \quad\frac{2r^{2}}{r_{\max}^{2}} + \frac{r^{4}}{r_{\max}^{4}}} )}},{I = {I_{0}( {1 - \frac{3r^{2}}{r_{\max}^{2}} + \frac{3r^{4}}{r_{\max}^{4}} - \frac{r^{6}}{r_{\max}^{6}}} )}},$Gaussian, inverse Gaussian, or a flat top profiles where r in each caserepresents the radius of the projected pattern. Each different intensityprofile needs a new, individual mask to be placed in the projectionsystem.

By using a LCD or a DLP to generate customized irradiation intensityprofiles, the time and expense of making a static, customized mask canbe eliminated. Each customized irradiation intensity profile can begenerated on a computer screen and then transferred to the LCD or DLPprojector. The variable pattern on the computer screen can be producedwith an equation representing a 3-D image of the intensity pattern. Theparameters of the equation can be varied using a nomogram obtained fromuse of a wavefront analysis system to calculate the shape of the desiredirradiation intensity profile.

In another embodiment, a DLP is used for the purpose of generating anirradiation profile/mask for UV irradiation of the light adjustableaberration conjugator layer. A commercial DLP projector (such as sold byInfocus, Inc.), can be purchased, the optics and light source can beremoved, and replaced with a UV light source and lens system. The opticsand light source can be replaced to irradiate the conjugator layer.Script can be generated using commercial or personally developedmathematical and graphics software programs to view 3-D intensityprofiles and 2-D intensity projections of those profiles. The computercan then be connected to the modified commercial projector andconjugator layers can be irradiated with various patterns, intensitylevels, and exposure times to generate one or more irradiationnomograms. Typical intensity levels range from 2 to 10 mW/cm2 andtypical exposure times range from 10 to 60 seconds.

Irradiation Profiling System

The nature of the irradiation profiling system will depend on the typeof radiation used, such as, e-beam, microwave, radio frequency,acoustic, or optical. Optical lenses and apodizing filters can be usedwith an arc lamp. A customized pattern of irradiation generates acustomized refraction change in the light adjustable aberrationconjugator layer. The apodized pattern can be generated using severalmethods and take different forms. For example, the desired transmissionpattern could be a static mask pattern imaged onto photographic film,photochemically etched onto a substrate using a pattern generatingmachine, or chrome applied to the appropriate substrate using chemicalvapor deposition (CVD). This type of static pattern can possess eithercontinuous or half tone structure. In addition, the desired patterncould be dynamic such as that produced by an appropriate spatial lightmodulator (SLM; e.g. a liquid crystal display (LCD) or a digital mirrordevice (DMD)), rotating or translating patterns, or any other method tovary the intensity profile or integration time of the exposed radiationdynamically. Some lasers are naturally apodized and may not requirefurther intensity modulation for correcting aberrations. A photographicfilm mask can be placed between two glass slides to produce a 3-Dintensity profile in a UV projection system similar to a conventionalslide projector. The main components are a UV light source, condenseroptics, a field lens, an apodizing filter, and projection optics.

Another potential source for producing a spatially defined, variableintensity pattern is a UV vertical cavity surface-emitting laser(VCSEL). In a VCSEL, light propagates vertically rather than laterallythrough the structure. With this orientation the laser cavity can begrown to match the wavelength of laser light. With such a small cavity,the gain bandwidth of the device can only support a single longitudinalmode. In contrast to the use of static mask or dynamic light modulator(e.g. LCD or DMD) a VCSEL array would only require a laser array, lensmatrix array, and projection optics. Thus, the advantages are lower costand complexity. A controlled VCSEL 2-D array of lasers replaces a maskor SLM, and the light source with its associated condenser optics toirradiate a light adjustable aberration conjugator layer. VCSELs can besingle element lasers, 1-D arrays, or 2-d arrays. Each laser elementemits a nearly square laser beam from the top surface in a narrow coneof light. Most of the research on these devices has been in the near IRfor telecommunication applications. Some visible arrays have beendeveloped for scanning and detecting images. The fill factor for 2-darrays is usually small because of the space needed for the leads. Lensarrays can be placed on top of the VCSEL arrays to obtain fill factorsgreater than 90%. These lasers have very high modulation frequencies. Ifit is too difficult to control the intensity of the lasers, the energyin the exposure can be controlled with pulse width modulation or othermodulation methods. By spatially controlling the intensity or averageenergy in each laser, one can produce an effective beam intensityprofile. This pattern/profile is then imaged onto the light adjustableaberration conjugator layer to produce the desired refraction pattern.The advantage is direct and instantaneous or nearly instantaneouscontrol of the irradiation pattern and increased pattern combinations.UV-VCSEL arrays are described in Photomiss Spectra, March 2001, p. 30,incorporated herein by reference. Since the same beam profile variationcan be accomplished with various types of spatial light modulators andstandard display or projection optics, advantages in the use ofUV-VCSELs are in the simplicity and size of the packaging issues, whichcan be important when the irradiation system is combined with thewavefront sensor and some type of viewing and video capability.

Locking System

Once the aberrations are corrected, locking irradiation is applied. Anexample of locking irradiation is a “top hat” intensity profile. Theobvious feature of this type of profile is that an even amount ofintensity is applied to the conjugator layer. A further example of aphotolocking intensity (I) profile may be one corresponding to theequation $I = {I_{0}( {1 - \frac{r^{2}}{r_{\max}^{2}}} )}$where I₀ is the peak intensity of the beam, r is the radius across theconjugator layer, and r_(max) is radius of the image beam on theconjugator layer. Such a profile is useful for cases when a UV or otherwavelength range absorbing additive is placed in the light adjustableaberration conjugator layer. If the conjugator layer possesses avariable thickness across its diameter, and contains a light blockingspecies with a strong absorption band at the wavelength(s) used forphotolocking the aberration conjugator layer, locking irradiation can beprevented by from reaching the back of the layer. Such a situation wouldcause RMC to diffuse from the back of the light adjustable conjugatorlayer towards the front of the light adjustable conjugator layer. Thisaction has the affect of flattening the back surface effectivelychanging the power of the conjugator layer. By placing a$I = {I_{0}( {1 - \frac{r^{2}}{r_{\max}^{2}}} )}$profile down onto the light adjustable aberration conjugator layersurface with sufficient intensity to completely penetrate the centralthickest part of the conjugator layer as well as the thinner edges,photolocking is possible.In General

Although the present invention and its advantages have been described indetail, it should be understood that various changes, substitutions andalterations can be made herein without departing from the spirit andscope of the invention as defined by the appended claims. Moreover, thescope of the present application is not intended to be limited to theparticular embodiments of the process, machine, manufacture, compositionof matter, means, methods and/or steps described in the specification.As one of ordinary skill in the art will readily appreciate from thedisclosure of the present invention, processes, machines, manufacture,compositions of matter, means, methods, or steps, presently existing orlater to be developed that perform substantially the same function orachieve substantially the same result as the corresponding embodimentsdescribed herein may be utilized according to the present invention.Accordingly, the appended claims are intended to include within theirscope such processes, machines, manufacture, compositions of matter,means, methods, or steps.

1-24. (canceled)
 25. A method for correcting at least one aberration inan optical system, comprising: providing a radiation adjustable layer toa component of the system; determining the at least one aberration; andapplying radiation to the radiation adjustable layer such as to modifyan optical characteristic of the radiation adjustable layer to at leastpartially compensate for the at least one aberration; wherein theadjustable layer comprises a radiation sensitive refraction modulatingcomposition.
 26. The method of claim 25 wherein the component is arefractive element.
 27. The method of claim 25 wherein the component isa reflective element.
 28. The method of claim 25 wherein the opticalsystem is selected from the group consisting of: a telescope, and acamera.
 29. The method of claim 25 wherein the applying comprises:applying the radiation in a pattern based on the determining the atleast one aberration.
 30. The method of claim 29 wherein the pattern isopposite in phase to the determined aberration.
 31. The method of claim29 wherein the applying comprises: generating the radiation with avertical-cavity surface-emitting laser array.
 32. The method of claim 29wherein the applying comprises: using an apodizing filter having apredetermined transmission intensity profile to form the pattern. 33.The method of claim 29 wherein the applying comprises: using a liquidcrystal cell to form the pattern.
 34. The method of claim 29 wherein theapplying comprises: using a spatial light modulator to form the pattern.35. The method of claim 29 wherein the applying comprises: using adigital light processor to form the pattern.
 36. The method of claim 29wherein the applying comprises: using a digital mirror device to formthe pattern.
 37. The method of claim 29 wherein the pattern has anintensity profile that changes as the radius of the pattern increasesfrom the center of the pattern.
 38. The method of claim 25 wherein theapplying comprises: controlling the radiation during the applying. 39.The method of claim 38 wherein the controlling comprises: controlling atleast one of intensity and duration of the radiation.
 40. The method ofclaim 25 wherein the radiation is ultraviolet light.
 41. The method ofclaim 25 wherein the determining comprises: using a Shack-Hartmannsensor to determine the aberration.
 42. The method of claim 25 furthercomprising: irradiating, subsequent to applying, the adjustable layer tolock in the modified characteristic.
 43. The method of claim 43, whereinthe irradiating comprises: applying a lock-in pattern that has a top hatintensity profile.
 44. The method of claim 43, wherein the irradiatingcomprises: applying a lock-in pattern that has an intensity profile thatdiminishes as the radius increases from the center.